ESA

Optics and Opto-Electronics Laboratory

The Optics and Opto-Electronics Laboratory (OOEL) is a joint laboratory of the Optics (TEC-MMO) and Opto-Electroncis (TEC-MME) sections at ESTEC

The OOEL provides expert advice with a state-of-the-art laboratory to:

  • Evaluate promising novel technologies prior to industrial activities
  • Independently assess the outcome of industrial activities in support to ESA’s projects and Research & Development efforts
  • Experimentally support root-cause-analysis for system or component level malfunctions
  • Maintain hands-on experience and competence of staff and trainees (Young Graduate Trainees and interns)
For general enquires regarding this TEC location please refer to the assigned contacts:

Dana Tomuta

Laboratory Manager

Christoph Voland

Laboratory Manager
For testing requests, access to lab facilities, training and consultancy services, please refer to:

THIRD PARTY ACTIVITIES

TPA Management system

OOEL provides services in the following domains:

Laser-induced contamination mitigation
Laser-induced damage testing
Laser diode characterisation
CCD & CMOS detector validation
Tailored laser-based measurements

Stray light (angle-resolved scatterometry and BSDF) with data analysis

High-resolution spectral transmittance and reflectance (200 to 2500 nm)
Surface form and wavefront error (@633 nm)
Microscopic surface topography and 2d roughness profilometry (white light interferometry)
Solar simulator absolute irradiance radiometry
Spectral and Radiometric calibration

Related fields of interest

Related fields of interest for the laboratory include fibre optic communication links as well as fibre optic sensor networks serving as a satellite's nervous system, optical multiplexing techniques, advanced detectors and arrays and the effects of the space environment on opto-electronic devices.

Lab Overview

The laboratory's current emphasis is on characterising and/or calibrating detectors and small cameras, optical components, laser beams and other optical signals. 

It includes a Class 10,000 (ISO 7) cleanroom, two fully equipped optoelectronics laboratories designed for the operation of Class 4 laser systems (defined as powerful enough to burn skin, cause permanent eye damage or ignite flammable material), workshop and storage rooms. 

It has the equipment necessary to measure the optical spectrum, beam profile, power and energy, stability and modulation response, in free space as well as optical fibres.

FACILITIES AND STATIONS

Calibration facility

Calibration facility is intended to calibrate and support the on ground calibration campaigns of small instruments, sub-systems etc

Instruments & technical parameters

Calibrated Integrating Sphere

Sun Simulator (radiance exitance about 4-6x 1014 [photons cm-2 nm-1 s-1])

Photodiodes and spectrometers

Radiometer

CW tunable laser source

Detector Characterization Facility

The detector characterisation facility is used to characterise CCD detectors and cameras for Earth observation payloads. It is also used to optimise detector operations, produce custom readout electronics and as the ability to conduct cryogenic tests down to 100K and radiometric illuminations using QTH lamps, filters, LEDs or spot projectors amongst others.

Instruments & technical parameters

Testing bare CCD detectors

Optimisation of detector operation and data validation

Custom readout electronics

Radiometric illumination

 QTH Lamp, filters and variable / Aperture Various LEDs, CW or pulsed / Spot Projector

Take Measurements of:

  • Dark current and DSNU
  • Non-linearity
  • Gain
  • Charge transfer efficiency
  • QE
  • PRNU
  • MTF

Optical Ground Station (Tenerife)

The Optical Ground Station, based in Tenerife, supports the in orbit testing of optical communication terminals. The station has a 1m telescope, can conduct realistic atmospheric test paths and optical feeder links for telecommunications satellites. 

Instruments & technical parameters

  • 1m telescope
  • 2400m above sea level
  • Atmospheric test paths
  • Optical feeder links
MEASUREMENTS

Stray light measurement and analysis (BSDF)

Straylight characterisation of optical components is a critical parameter used to compute the overall straylight on instrument level.

Instruments & Technical parameters:

  • CASI scatterometer – high resolution close to specular (down to 0.10), multiple wavelengths available on request
  • Albatross TT – 3D Angular scatterometer @532nm
  • High-angular resolution scatterometer.

Interferometry

Optical metrology is an extremely versatile laboratory inspection tool, and has an important role to play in the verification of quality for optical surfaces. Laser interferometers support and enable the most demanding metrology applications and can characterize the Surface form and Wavefront error of optical components, such as lenses or mirrors. 

Instruments & Technical parameters:

  • DynaFiz at 633 nm (100 mm diam, Range 31 to 6000 nm PV)

Optical inspection and topography

Optical surface quality and topography are complementary inspection techniques of optical surfaces.

Instruments & techical paramters:

  • White light interferometric microscope using Veeco/Brucker GTX8 3d surface topography at sub-nm level
  • Zeiss microscopes

ESA.INT FEED
12.02.2024

New optical polishing techniques for aspherical and free form lenses

08.02.2024

ESA shipping container's laser link to space

07.02.2024

Observing from the roof of ETOGS

13.12.2023

Highest performance optical filters developed for Athena mission

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